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Altitude and Underground Real-Time SER Characterization of CMOS 65 nm SRAM

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8 Author(s)
Autran, J.L. ; CNRS, Aix-Marseille Univ., Marseille, France ; Roche, P. ; Sauze, S. ; Gasiot, G.
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We report real-time SER characterization of CMOS 65 nm SRAM memories in both altitude and underground environments. Neutron and alpha-particle SERs are compared with data obtained from accelerated tests and values previously measured for CMOS 130 nm technology.

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Nuclear Science, IEEE Transactions on  (Volume:56 ,  Issue: 4 )