Investigation of Growth Conditions of CdTe Thick Films on Properties and Demands for X-Ray Detector Applications

CdTe thick films were prepared by vacuum deposition on amorphous substrates using MBE technique. The growth was performed at different temperatures to investigate the development of the growth rate, surface morphology, structure and optical properties. Properties of films deposited with a single CdTe source are compared with films grown with an additional Cd source. The growth experiments are discussed with regard to demands for X-ray detector applications.