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The Path and Challenges to 90-nm Radiation-Hardened Technology

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8 Author(s)
Nadim F. Haddad ; Electron. & Integrated Solutions, BAE Syst., Inc., Manassas, VA, USA ; Ernesto Chan ; Scott Doyle ; Andrew T. Kelly
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Radiation effects analysis on a commercial 90-nm CMOS process has been performed to evaluate hardness potential from a process and design perspective, and to identify techniques to promote radiation hardness enhancement towards achieving suitability for low power space applications.

Published in:

IEEE Transactions on Nuclear Science  (Volume:56 ,  Issue: 4 )