Scheduled System Maintenance:
Some services will be unavailable Sunday, March 29th through Monday, March 30th. We apologize for the inconvenience.
By Topic

The Path and Challenges to 90-nm Radiation-Hardened Technology

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.
8 Author(s)
Haddad, N.F. ; Electron. & Integrated Solutions, BAE Syst., Inc., Manassas, VA, USA ; Chan, E. ; Doyle, S. ; Kelly, A.T.
more authors

Radiation effects analysis on a commercial 90-nm CMOS process has been performed to evaluate hardness potential from a process and design perspective, and to identify techniques to promote radiation hardness enhancement towards achieving suitability for low power space applications.

Published in:

Nuclear Science, IEEE Transactions on  (Volume:56 ,  Issue: 4 )