By Topic

Wideband Reference-Plane Invariant Method for Measuring Electromagnetic Parameters of Materials

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Khattiya Chalapat ; Dept. of Phys., Univ. of Jyvaskyla, Jyvaskyla, Finland ; Kari Sarvala ; Jian Li ; Gheorghe Sorin Paraoanu

This paper presents a simple and effective wideband method for the determination of material properties, such as the complex index of refraction and the complex permittivity and permeability. The method is explicit (noniterative) and reference-plane invariant: it uses a certain combination of scattering parameters in conjunction with group-velocity data. This technique can be used to characterize both dielectric and magnetic materials. The proposed method is verified experimentally within a frequency range between 2-18 GHz on polytetrafluoroethylene and polyvinylchloride samples. A comprehensive error and stability analysis reveals that, similar to other methods based on transmission/reflection measurement, the uncertainties are larger at low frequencies and at the Fabry-Perot resonances.

Published in:

IEEE Transactions on Microwave Theory and Techniques  (Volume:57 ,  Issue: 9 )