Cart (Loading....) | Create Account
Close category search window

Speed determination of single Sr adatoms moving within Si(111)-7×7 half unit cells

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Zhachuk, R. ; Institute of Semiconductor Physics, pr. Lavrentyeva 13, Novosibirsk 630090, Russia ; Teys, S. ; Olshanetsky, B. ; Pereira, S.

Your organization might have access to this article on the publisher's site. To check, click on this link: 

In this paper we report on the motion of individual Sr adatoms within the limits of Si(111)-7×7 half unit cells (HUCs). The fast movement of the atom at the Si surface produces sharp signal fluctuations in scanning tunneling microscopy (STM) images resulting into noiselike patches. It is found that the length of the observed image streaks is a function of the scanning tip velocity. A Monte Carlo simulation implementing a model of independently moving Sr adatom and scanning tip, accounts for the observed STM image features quantitatively. Thus, by colleting STM images at various scanning speeds and matching simulated image features to the experimental observations, allows the average speed of Sr adatom within the limits of Si(111)-7×7 HUC to be estimated: 300 nm/s.

Published in:

Applied Physics Letters  (Volume:95 ,  Issue: 6 )

Date of Publication:

Aug 2009

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.