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Practical test cores for the on-chip generation and evaluation of analog test signals: Application to a network/spectrum analyzer for analog BIST

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3 Author(s)
Barragán, M.J. ; Inst. de Microelectron. de Sevilla, Univ. de Sevilla, Sevilla, Spain ; Vazquez, D. ; Rueda, A.

This paper presents practical implementations of test cores for analog and mixed-signal BIST. A sinewave generator for test stimulus generation, and a periodical signal characterization system for response evaluation are discussed. Integrated prototypes and experimental results are provided, and a prototype of a network/spectrum analyzer featuring both test cores has been developed and tested in the lab.

Published in:

Research in Microelectronics and Electronics, 2009. PRIME 2009. Ph.D.

Date of Conference:

12-17 July 2009

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