By Topic

Design-for-test approach of an asynchronous network-on-chip architecture and its associated test pattern generation and application

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Tran, X.T. ; CEA-LETI, MINATEC, Grenoble, France ; Thonnart, Y. ; Durupt, J. ; Beroulle, V.
more authors

Asynchronous design offers an attractive solution to address the problems faced by networks-on-chip (NoC) designers such as timing constraints. Nevertheless, post-fabrication testing is a big challenge to bring the asynchronous NoCs to the market because of a lack of testing methodology and support. This study first presents the design and implementation of a design-for-test (DfT) architecture, which improves the testability of an asynchronous NoC architecture. Then, a simple method for generating test patterns for network routers is described. Test patterns are automatically generated by a custom program, given the network topology and the network size. Finally, we introduce a testing strategy for the whole asynchronous NoC. With the generated test patterns, the testing methodology presents high fault coverage (99.86%) for single stuck-at fault models.

Published in:

Computers & Digital Techniques, IET  (Volume:3 ,  Issue: 5 )