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SiC Wirebond Multichip Phase-Leg Module Packaging Design and Testing for Harsh Environment

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7 Author(s)
Puqi Ning ; Center for Power Electron. Syst., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA ; Rixin Lai ; Huff, D. ; Fei Wang
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In order to take full advantage of SiC, a high-temperature wirebond package for multichip phase-leg power module using SiC devices was designed, developed, fabricated, and tested. The details of the material comparison and selection are described, thus culminating a feasible solution for high-temperature operation. A thermal cycling test with large temperature excursion (from -55??C to 250??C) was carried out to evaluate the thermomechanical reliability of the package. During the test, the substrate failed before other parts in 20 cycles. A sealing edge approach was proposed to improve the thermal reliability of the substrate. With the strengthening of the sealing material, the substrate, die-attachment, and wirebond assemblies exhibited satisfactoriness in the thermomechanical reliability tests. In order to evaluate the high-temperature operation ability of designed package, one prototype module was designed and fabricated. The high-temperature continuous power test shows that the package presented in this paper can perform well at 250??C junction temperature.

Published in:
Power Electronics, IEEE Transactions on  (Volume:25 ,  Issue: 1 )

Date of Publication: Jan. 2010

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