By Topic

Sensitivity Analysis of Burst Detection and RF Fingerprinting Classification Performance

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
R. Klein ; Air Force Inst. of Technol., Wright-Patterson AFB, OH, USA ; M. A. Temple ; M. J. Mendenhall ; D. R. Reising

There has been a recent shift toward improving wireless access security within the OSI PHY layer by exploiting RF features that are inherently device specific and difficult to replicate by an unintended party. This work addresses the extraction and exploitation of RF "fingerprints" to classify emissions and provide device-specific identification. Burst transient detection precedes RF fingerprint extraction and is generally the most critical step in the overall process. This work provides a much needed sensitivity analysis of burst detection capability. The analysis is conducted using instantaneous amplitude responses with both Fractal-Bayesian Step Change Detection (Fractal-BSCD) and Variance Trajectory (VT) processes. The performance of each method is evaluated under varying SNR conditions using experimentally collected 802.11a OFDM signals. The impact of transient detection error on signal classification performance is then demonstrated using RF fingerprints and Multiple Discriminant Analysis (MDA) with Maximum Likelihood (ML) classification. The VT technique emerges as the better alternative for all SNRs considered and yields MDA-ML classification accuracy that is consistent with "perfect" transient estimation performance.

Published in:

2009 IEEE International Conference on Communications

Date of Conference:

14-18 June 2009