Cart (Loading....) | Create Account
Close category search window
 

A Novel Ray Tracing Based Multipath Modeling Approach for Site-Specific WLAN Simulations

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Ting Zhou ; Comput. & Electron. Eng. Dept., Univ. of Nebraska-Lincoln, Omaha, NE, USA ; Sharif, H. ; Hempel, M. ; Mahasukhon, P.
more authors

Current propagation models used in network simulations neglect obstacles of a propagation environment and employ over-simplified assumptions that the received signal strength is a simple function of distance and the transmission area of a node is circular. These assumptions are in contradiction with the actual tests and the measurement results. To run reasonable simulations for evaluating the performance of a specific outdoor wireless testbed, a novel multipath propagation framework is proposed in this paper, which is based on the ray tracing technique and uses site-specific geographic data of the analyzed area. It provides accurate propagation predictions, and it does not significantly prolong the simulation duration.

Published in:

Communications, 2009. ICC '09. IEEE International Conference on

Date of Conference:

14-18 June 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.