Cart (Loading....) | Create Account
Close category search window

A Nonlinear Filter Based on Row and Column Operation for Positive Impulsive Noise Reduction

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Shuyue Chen ; Sch. of Inf. Sci. & Eng., Jiangsu Polytech. Univ., Changzhou, China ; Yun Qiu ; Jun Feng

The positive impulsive noise may be caused by electron radiation in the photo-electronic imaging system. A novel nonlinear filter based on row and column filtering(RCF) was presented and its denoise and detail preservation properties were analyzed. According to the statistical behaviors of each row and column of an image, the pixel value is determined by its neighborhood. Each row is operated firstly. Then each column processing gives the final result. The given filter was compared with median filter, recursive median filter, adaptive filter and robust statistical adaptive filter through the computer simulations. It is shown that the filter is of a high performance for positive impulsive noise removal and detail preservation.

Published in:

Information Processing, 2009. APCIP 2009. Asia-Pacific Conference on  (Volume:2 )

Date of Conference:

18-19 July 2009

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.