Cart (Loading....) | Create Account
Close category search window
 

Numerical Analysis of Scattering by Dielectric Random Rough Surfaces Using Modified SMCG Scheme and Curvilinear RWG Basis Functions

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Huang, S.W. ; Sch. of Electron. Eng. & Comput. Sci., Peking Univ., Beijing, China ; Zhang, G.H. ; Xia, M.Y. ; Chan, C.H.

An augmented sparse-matrix canonical-grid (SMCG) approach for numerical analysis of scattering by dielectric random rough surfaces is developed. It is an extension of the previous modified SMCG scheme for perfect-electric-conducting (PEC) surfaces to dielectric cases, and is enhanced by adopting curved triangulation modeling. By using the curved modeling with curvilinear Rao-Wilton-Glisson basis functions (CRWG bases), the number of unknowns can be reduced substantially to extract results of the same accuracy, compared with using the planar triangular discretization with planar RWG bases. Numerical results for Gaussian and ocean-like dielectric rough surfaces are provided to confirm the validity and efficacy of the proposed method.

Published in:

Antennas and Propagation, IEEE Transactions on  (Volume:57 ,  Issue: 10 )

Date of Publication:

Oct. 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.