Cart (Loading....) | Create Account
Close category search window

3-D reconstructions of nanometer-scale helical objects from cryo electron microscopy images

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Lee, S. ; Biomed. Eng. & Electr. & Comput. Eng., Cornell Univ., Ithaca, NY, USA ; Chen, Q. ; Doerschuk, P.C.

Statistical algorithms are described for 3-D signal reconstruction problems where the object has a helical symmetry with unknown symmetry parameters and the data is cryo electron micrographs of multiple identical instances of the object. Two object models are described: a Fourier-Bessel series model for a helical object and a spherical harmonics series model for a motif which is then replicated in an array to form a helical object where, in both cases, the unknown parameters are the coefficients in the series. The measured images are essentially noisy 2-D projections of the 3-D electron scattering intensity where the projection orientation is not known. A maximum likelihood estimator computed by an expectation-maximization algorithm is used in both cases to estimate the unknown parameters.

Published in:

Biomedical Imaging: From Nano to Macro, 2009. ISBI '09. IEEE International Symposium on

Date of Conference:

June 28 2009-July 1 2009

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.