By Topic

Dependence of external optical feedback sensitivity on structural parameters of DFB semiconductor lasers

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Alam, M.F. ; Center for Electro-Opt., Dayton Univ., OH, USA ; Karim, M.A. ; Islam, S.

External optical feedback sensitivity in distributed feedback (DFB) semiconductor lasers is analyzed in this paper with special attention to phase-shifted and complex-coupled lasers. The effects of variations of structural parameters such as index and/or gain coupling strengths, facet reflectivities, and corrugation phase angles on external optical feedback sensitivity are studied. Quarter-wave-shifted index-coupled DFB lasers exhibit low external optical feedback sensitivity for large index coupling coefficients and high facet reflectivities. Pure gain-coupled DFB lasers perform better than the uniform index-coupled DFB lasers without any phase-shifting structure but worse than λ/4 phase-shifted index-coupled lasers with high coupling strengths. External optical feedback sensitivity of complex-coupled lasers is a sensitive function of the structural parameters and varies significantly with the index-to-gain coupling ratio and the total coupling. Presence of a small amount of index coupling relative to the gain coupling in a gain-coupled laser improves the external optical feedback sensitivity

Published in:

Aerospace and Electronics Conference, 1996. NAECON 1996., Proceedings of the IEEE 1996 National  (Volume:2 )

Date of Conference:

20-23 May 1996