By Topic

Modeling SWCNT Bandgap and Effective Mass Variation Using a Monte Carlo Approach

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Karim El Shabrawy ; School of Electronics and Computer Science, University of Southampton, Southampton, U.K. ; Koushik Maharatna ; Darren Bagnall ; Bashir M. Al-Hashimi

Synthesizing single-walled carbon nanotubes (SWCNTs) with accurate structural control has been widely acknowledged as an exceedingly complex task culminating in the realization of CNT devices with uncertain electronic behavior. In this paper, we apply a statistical approach in predicting the SWCNT bandgap and effective mass variation for typical uncertainties associated with the geometrical structure. This is first carried out by proposing a simulation-efficient analytical model that evaluates the bandgap (Eg) of an isolated SWCNT with a specified diameter (d) and chirality (??). Similarly, we develop an SWCNT effective mass model, which is applicable to CNTs of any chirality and diameters >1 nm. A Monte Carlo method is later adopted to simulate the bandgap and effective mass variation for a selection of structural parameter distributions. As a result, we establish analytical expressions that separately specify the bandgap and effective mass variability (Eg??, m?? *) with respect to the CNT mean diameter (d??) and standard deviation (d??). These expressions offer insight from a theoretical perspective on the optimization of diameter-related process parameters with the aim of suppressing bandgap and effective mass variation.

Published in:

IEEE Transactions on Nanotechnology  (Volume:9 ,  Issue: 2 )