By Topic

Alpha particle and neutron-induced soft error rates and scaling trends in SRAM

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Hajime Kobayashi ; Sony Corporation, Atsugi Tec. No.2, 4-16-1 Okata Atsugi-shi, Kanagawa, 243-0021 Japan ; Nobutaka Kawamoto ; Jun Kase ; Ken Shiraish

We performed underground real-time tests to obtain alpha particle-induced soft error rates (alpha-SER) with high accuracies for SRAMs with 180 nm - 90 nm technologies and studied the scaling trend of alpha-SERs. In order to estimate the maximum permissive rate of alpha emission from package resin, the alpha-SER was compared to the neutron-induced soft error rate (n-SER) obtained from accelerated tests. We found that as devices are scaled down, the alpha-SER increased while the n-SER slightly decreased, and that the alpha-SER could be greater than the n-SER in 90 nm technology even when the ultra-low-alpha (ULA) grade, with the alpha emission rate < 1 times 10-3 cm-2h-1, was used for package resin. We also performed computer simulations to estimate scaling trends of both alpha-SER and n-SERup to 45 nm technologies, and noticed that the alpha-SER decreased from 65 nm technology while the n-SER increased from 45 nm technology due to direct ionization from the protons generated in the n + Si nuclear reaction.

Published in:

2009 IEEE International Reliability Physics Symposium

Date of Conference:

26-30 April 2009