Cart (Loading....) | Create Account
Close category search window
 

Non-linear Bundle Adjustment for Electron Tomography

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Phan, S. ; Nat. Center For Microscopy & Imaging Res., Univ. of California, La Jolla, CA, USA ; Bouwer, J. ; Lanman, J. ; Terada, M.
more authors

High quality tomographic reconstruction from electron microscope images requires precise alignment of the images. This cannot be accomplished by simple 2D image transformations because the electron trajectories through the object are curvilinear. Accordingly, the alignment process requires an inferred object position and, in addition, nonlinear projection maps for each image. This may be accomplished by means of a generalized bundle adjustment when a consistent set of point-like objects is visible in each EM image. Alternatively, alignment may be accomplished by an extension of the method of occluded contours when a consistent set of linear features, such as projected outlines of surfaces can be identified. In the first case, we report on new results derived from multiple tilt series data, and in the second we report on high quality alignment and reconstruction when the number of point features is insufficient for proper alignment.

Published in:

Computer Science and Information Engineering, 2009 WRI World Congress on  (Volume:1 )

Date of Conference:

March 31 2009-April 2 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.