By Topic

A New Method on Measures of Similarity between Vague Sets

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Feng-Sheng Xu ; Dept. of Comput. Sci. & Technol., Dezhou Univ., Dezhou, China

The drawbacks of existing methods on measures of similarity between vague sets are pointed out, a new method on measures of similarity between vague sets is proposed and is proved to satisfy some critions, and its validity and advantage are illustrated by some examples.

Published in:

Computer Science and Information Engineering, 2009 WRI World Congress on  (Volume:4 )

Date of Conference:

March 31 2009-April 2 2009