By Topic

Method for automatic detection of the reasons of unusual system behavior by evaluation of correlation between events in monitoring tool

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Ekaterina A. Gorelkina ; Advanced Software Group, Samsung Research Center in Moscow, Russia ; Sergey S. Grekhov ; Jaehoon Jeong ; Mikhail P. Levin

This article describes the method related to simplifying detection of the problem reason in applications by using automatic analyzing of monitoring data on embedded system. Usually, dependencies in monitoring data are not obvious and usually it is very complicated to find the relationship between error symptom and the reason of the problem. The suggested method finds dependencies in system behavior automatically that gets the chance to detect hidden reasons of the problem in huge amount of monitoring data. In particular, the proposed method detects the unusual system behavior and tries to find the most probable reason of such behavior by using statistical data mining algorithms. It structures monitoring data by special way and most probable reason of the problem is colored by monitoring tool to help the developer to analyze the system behavior more comfortable and more precise. The experiments show that this method can detect a wide set of problems in system behavior that accelerates and improves the analysis of system behavior according to monitoring information.

Published in:


Date of Conference:

18-23 May 2009