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Core-Based Testing of Embedded Mixed-Signal Modules in a SoC

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4 Author(s)
Zivkovic, V.A. ; NXP Semicond., Netherlands ; Schat, J. ; van der Heyden, F. ; Seuren, G.

This article describes test development for embedded mixed-signal and RF modules in core-based design. The test development approach is fully automated and encompasses a DFT architecture that supports an arbitrary test method. Fully compliant with existing IEEE test standards, the proposed approach has been used for test development and characterization of mixed-signal cores in several industrial products. Two SoC examples emphasize its benefits and performance.

Published in:

Design & Test of Computers, IEEE  (Volume:26 ,  Issue: 3 )