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Automating IEEE 1500 Core Test—An EDA Perspective

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2 Author(s)
Chakravadhanula, K. ; Cadence Design Syst., Endicott, NY, USA ; Chickermane, V.

Standardized design and test practices enable automation. This article describes a methodology and corresponding tool set that combines automated support for IEEE Std 1500 and test data compression in one. In this article, we also provide some solutions to the problem of migrating core test patterns to the SoC design.

Published in:

Design & Test of Computers, IEEE  (Volume:26 ,  Issue: 3 )

Date of Publication:

May-June 2009

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