Cart (Loading....) | Create Account
Close category search window
 

Curvelet based no-reference objective image Quality Assessment

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Ji Shen ; Dept. of Math., Florida State Univ., Tallahassee, FL, USA ; Qin Li ; Erlebacher, G.

In this paper, we propose a new general Quality Assessment method based on the curvelet transform, called Curvelet No-Reference (CNR) model, which can estimate levels of noise, blur and JPEG 2000 compression of natural images. The peak coordinate of the curvelet coefficient histogram occupies distinctive regions depending on how the image was modified from the original. During training, we associate peak positions with known filter levels. In the prediction stage, the filter levels of new images are estimated from the training data, with no access to the reference images. We tested CNR both on our own image dataset and on LIVE. Results demonstrate that CNR does a better job at predicting noise and blur levels among several methods, including SSIM and PSNR. We also present an accelerated version of CNR that does not sacrifice prediction accuracy on natural images.

Published in:

Picture Coding Symposium, 2009. PCS 2009

Date of Conference:

6-8 May 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.