By Topic

Process Variation-Aware Test for Resistive Bridges

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Ingelsson, U. ; Sch. of Electron. & Comput. Sci., Univ. of Southampton, Southampton, UK ; Al-Hashimi, B.M. ; Khursheed, S. ; Reddy, S.M.
more authors

This paper analyzes the behavior of resistive bridging faults under process variation and shows that process variation has a detrimental impact on test quality in the form of test escapes. To quantify this impact, a novel metric called test robustness is proposed and to mitigate test escapes, a new process variation-aware test generation method is presented. The method exploits the observation that logic faults that have high probability of occurrence and correspond to significant amounts of undetected bridge resistance have a high impact on test robustness and therefore should be targeted by test generation. Using synthesized International Symposium on Circuits and Systems benchmarks with realistic bridge locations, results show that for all the benchmarks, the method achieves better results (less test escapes) than tests generated without consideration of process variation.

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:28 ,  Issue: 8 )