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This paper analyzes the behavior of resistive bridging faults under process variation and shows that process variation has a detrimental impact on test quality in the form of test escapes. To quantify this impact, a novel metric called test robustness is proposed and to mitigate test escapes, a new process variation-aware test generation method is presented. The method exploits the observation that logic faults that have high probability of occurrence and correspond to significant amounts of undetected bridge resistance have a high impact on test robustness and therefore should be targeted by test generation. Using synthesized International Symposium on Circuits and Systems benchmarks with realistic bridge locations, results show that for all the benchmarks, the method achieves better results (less test escapes) than tests generated without consideration of process variation.