Notification:
We are currently experiencing intermittent issues impacting performance. We apologize for the inconvenience.
By Topic

Image Segmentation with a Unified Graphical Model

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Lei Zhang ; Rensselaer Polytech. Inst., Troy, NY, USA ; Qiang Ji

We propose a unified graphical model that can represent both the causal and noncausal relationships among random variables and apply it to the image segmentation problem. Specifically, we first propose to employ Conditional Random Field (CRF) to model the spatial relationships among image superpixel regions and their measurements. We then introduce a multilayer Bayesian Network (BN) to model the causal dependencies that naturally exist among different image entities, including image regions, edges, and vertices. The CRF model and the BN model are then systematically and seamlessly combined through the theories of Factor Graph to form a unified probabilistic graphical model that captures the complex relationships among different image entities. Using the unified graphical model, image segmentation can be performed through a principled probabilistic inference. Experimental results on the Weizmann horse data set, on the VOC2006 cow data set, and on the MSRC2 multiclass data set demonstrate that our approach achieves favorable results compared to state-of-the-art approaches as well as those that use either the BN model or CRF model alone.

Published in:

Pattern Analysis and Machine Intelligence, IEEE Transactions on  (Volume:32 ,  Issue: 8 )