Cart (Loading....) | Create Account
Close category search window

Fluorine microimaging and quantification using nuclear reaction analysis: A tool for validating tissue distribution of positron emission tomography tracers

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
Deves, G. ; Chimie Nucléaire Analytique et Bioenvironnementale, UMR 5084, CNRS/Université de Bordeaux, BP 120, 33175 Gradignan Cedex, France ; Roudeau, S. ; Carmona, A. ; Lavielle, S.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link: 

An application of ion beam microprobe analysis has been developed for the quantitative imaging of fluorine compounds in biological samples on a micrometer scale. The difficulty of imaging fluorine at trace level concentration in biological tissues has been addressed by using a combination of nuclear reaction analysis and proton resonant backscattering spectrometry. With this method, the limit of detection of fluorine in thin biological samples can be as low as 3 μg/g. Quantitative imaging of fluorodeoxyglucose distribution, the most widely used tracer for detection of solid tumors by positron emission tomography, is shown as an example of this application.

Published in:

Applied Physics Letters  (Volume:95 ,  Issue: 2 )

Date of Publication:

Jul 2009

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.