Cart (Loading....) | Create Account
Close category search window

A model of the exchange bias setting process in magnetic read sensors

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Barker, J. ; Department of Physics, The University of York, York YO10 5DD, United Kingdom ; Craig, B. ; Lamberton, R ; Johnston, A
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link: 

A model of the acquisition of exchange bias during the high temperature annealing process used to set the bias direction in the antiferromagnet is described. The model is applied to the investigation of the process of setting the bias direction in the antiferromagnetic layer, which comprises a high-temperature anneal in a field sufficiently large to saturate the ferromagnetic layers. It is shown that there is an optimal setting temperature depending on the material parameters. The temperature dependence of the antiferromagnetic anisotropy is shown to be an important factor in achieving maximum exchange bias.

Published in:

Applied Physics Letters  (Volume:95 ,  Issue: 2 )

Date of Publication:

Jul 2009

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.