Cart (Loading....) | Create Account
Close category search window
 

Neural network EM-Field based modeling for 3d substructure in finite element method

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Shaowei Liao ; Sch. of Electron. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China ; Jianhua Xu ; Kabir, H. ; Qi-Jun Zhang
more authors

Most existing neural network (NN) approaches for modeling EM problems are based on training with the S-parameter at the external input-output ports of the EM structures. In this paper we present a new method to describe EM behavior at the internal interface between decomposed 3D substructures. We train NNs to represent the EM behavior of the substructure as seen from the interface. This approach allows EM coupling effect between substructures to be better represented. The method is developed in the finite element method (FEM) environment. EM transfer function matrix is formulated to produce training data to allow the NN to learn the coupling between EM field variables at various locations across the entire interface of the 3D substructure. A new formulation allowing trained NN models to be connected with FEM equations of other substructures for efficient simulation of the overall EM structure is proposed. Examples of waveguide circuit simulations show that the proposed method provides better accuracy and efficiency over the conventional neural network method.

Published in:

Microwave Symposium Digest, 2009. MTT '09. IEEE MTT-S International

Date of Conference:

7-12 June 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.