By Topic

Middleware and Metrology for the Pervasive Future

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
Fillinger, A. ; Nat. Inst. of Stand. & Technol., MD, USA ; Hamchi, I. ; Degre, S. ; Diduch, L.L.
more authors

Looks at the data and metrology tools developed by The National Institute of Standards and Technology for the research community, including common middleware for distributed sensor data acquisition and processing.

Published in:

Pervasive Computing, IEEE  (Volume:8 ,  Issue: 3 )