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A Literature Review of IGBT Fault Diagnostic and Protection Methods for Power Inverters

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2 Author(s)
Bin Lu ; Innovation Center, Eaton Corp., Milwaukee, WI, USA ; Sharma, S.K.

This paper presents a survey on existing methods for fault diagnosis and protection of insulated gate bipolar transistors with special focus on those used in three-phase power inverters. Twenty-one methods for open-circuit faults and ten methods for short-circuit faults are evaluated and summarized, based on their performance and implementation efforts. The gate-misfiring faults and their diagnostic methods are also briefly discussed. Finally, the promising methods are recommended for future work.

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Industry Applications, IEEE Transactions on  (Volume:45 ,  Issue: 5 )