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Linking fabrication and parametric testing to VLSI design courses

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1 Author(s)
Pearson, R. ; Dept. of Microelectron. Eng., Rochester Inst. of Technol., NY, USA

The actual versus simulated performance of VLSI systems is dependent on the accuracy of the simulation model parameters and the soundness of the design rules used. Future process engineers must be schooled in VLSI design principles, while at the same time understanding the origin of the process based design rules and the statistical variation of device model parameters. This paper describes RIT's implementation of course work to meet these goals

Published in:

VLSI, 1995. Proceedings., Fifth Great Lakes Symposium on

Date of Conference:

16-18 Mar 1995