By Topic

Electrostatic Electron Microscopy. III

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Bachman, C.H. ; Electronics Laboratory, General Electric Company, Schenectady, New York ; Ramo, Simon

Your organization might have access to this article on the publisher's site. To check, click on this link: 

This article, the final one of a series on the design of electrostatic electron microscopes, contains a description of an instrument which illustrates the principles previously discussed. The microscope described is believed to be the first constructed with the object of providing the greatest of simplicity in construction, operation, and maintenance with the design parameters balanced to give a particular range of resolving power. The range chosen is about ten times the light microscope. The instrument is permanently aligned and utilizes external photography. The over‐all size and weight of the instrument, as well as the number and complexity of components, are materially less than previously described instruments.

Published in:

Journal of Applied Physics  (Volume:14 ,  Issue: 4 )