Close category search window
 

Formal validation of virtual finite state machines

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Flora-Holmquist, A.R. ; Dept. of Core Switching Dev., AT&T Bell Labs., Naperville, IL, USA ; Staskauskas, M.G.

We describe our experiences in introducing a formal validation tool in several projects that are developing software for AT&T's 5ESS telephone switching system. The tool validates networks of communicating processes implemented in the virtual finite state machine (VFSM) notation, using Holzmann's (1991) super-trace algorithm to check for errors in process interaction such as deadlock, livelock, unexpected inputs, message buffer overflow, and unreachable code. The validator has been used by several 5ESS developers to find bugs in their VFSM designs. We discuss the extent to which the validator has been successfully employed in 5ESS software development, and describe our present research efforts to eliminate some of the roadblocks that stand in the way of its more widespread use

Published in:
Industrial-Strength Formal Specification Techniques, 1995. Proceedings., Workshop on

Date of Conference: 5-8 Apr 1995

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.