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An easily-testable cube-connected cycles structure

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3 Author(s)
Yoon-Hwa Choi ; Dept. of Comput. Eng., Hong Ik Univ., Seoul, South Korea ; Ja-Young Choi ; Yu-Seok Kim

In this paper, we present an easily-testable cube-connected cycles (CCC) structure for VLSI/WSI implementation. The concept of boundary scan is used to provide test vectors and capture the resulting responses. A simple design modification is made to considerably reduce the test application time. The test access port of each processing element (PE) is utilized to perform comparisons between PEs. Single-bit comparators are appropriately placed in order to locate faults in the PEs and interconnection links in the CCC structure. The scheme is shown to be simple enough to be practically useful

Published in:

Wafer Scale Integration, 1995. Proceedings., Seventh Annual IEEE International Conference on

Date of Conference:

18-20 Jan 1995