Close category search window
 

Current Transport Mechanism and Control of the n -Value for Ag/Bi2212 Wires and Tapes

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Awaji, S. ; High Field Lab. for Supercond. Mater., Tohoku Univ., Sendai, Japan ; Inoue, T. ; Takahashi, K.-i. ; Badica, Petre
more authors

In order to study the mechanism of the small n-value for Bi2212, E- J characteristics were measured carefully for various kinds of Bi2212 tapes and round wires in high magnetic fields. Some of wires were heat-treated in a magnetic field of 5 T. We found that the n -values of all the samples increase by the in-field heat-treatment at 5 T. In addition, we analyzed the E- J properties by the combination of the percolation model based on the local Jc distribution and the two directional Jc distribution model. The improvement of the n-value by the in-field heat treatment can be understood by the change of the aspect-ratio of the grains. Therefore, the aspect-ratio of the grains plays an important role in the current transport influencing not only Jc but also n-value.

Published in:
Applied Superconductivity, IEEE Transactions on  (Volume:19 ,  Issue: 3 )

Date of Publication: June 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.