Cart (Loading....) | Create Account
Close category search window
 

An accurate PC aided carrier lifetime determination technique from diode reverse recovery waveform

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Omura, I. ; Res. & Dev. Center, Toshiba Corp., Kawasaki, Japan ; Nakagawa, A.

A novel technique for determining carrier lifetime from reverse recovery waveform of diodes is presented in this paper. The features of this technique are that the accuracy is significantly improved and lifetime is automatically calculated on a personal computer from waveform data measured by a digital oscilloscope. The proposed technique suits the recent digitization of measurement equipment, and hence simplifies the measurement procedure and improves accuracy of the lifetime measurement

Published in:

Power Semiconductor Devices and ICs, 1995. ISPSD '95., Proceedings of the 7th International Symposium on

Date of Conference:

23-25 May 1995

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.