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An accurate PC aided carrier lifetime determination technique from diode reverse recovery waveform

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2 Author(s)
Omura, I. ; Res. & Dev. Center, Toshiba Corp., Kawasaki, Japan ; Nakagawa, A.

A novel technique for determining carrier lifetime from reverse recovery waveform of diodes is presented in this paper. The features of this technique are that the accuracy is significantly improved and lifetime is automatically calculated on a personal computer from waveform data measured by a digital oscilloscope. The proposed technique suits the recent digitization of measurement equipment, and hence simplifies the measurement procedure and improves accuracy of the lifetime measurement

Published in:

Power Semiconductor Devices and ICs, 1995. ISPSD '95., Proceedings of the 7th International Symposium on

Date of Conference:

23-25 May 1995