By Topic

Comments on the use of the force mode in atomic force microscopy for polymer films

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
Aime, J.P. ; L.C.P.C. Université Bordeaux I, 351 Cours de la Libération, 33405 Talence Cedex, France ; Elkaakour, Z. ; Odin, C. ; Bouhacina, T.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.357777 

Atomic force microscopy (A.F.M.) was first described as a powerful technique for studying insulating, hard surfaces. Since then, it has also been considered as an appropriate technique for investigating, at a submicromic scale, elastic and viscoelastic properties of soft materials as polymer films. An attempt is made to show how macroscopic models can be fruitfully employed in order to interpret the force curves obtained in AFM on polymer films. Through an analysis of the slope variation and the way the instability occurs at the tip‐sample contact, it is shown that a macroscopic approach is a useful way to explain most of the features of the force curves. Furthermore the importance is underlined of the initial conditions. It is shown that for polymer samples which have a stiffness within the range of the probe one, drastic changes of the force curve shape can occur when the initial conditions vary. Finally, this approach should allow one to clarify the conditions for which the macroscopic approach fails.

Published in:

Journal of Applied Physics  (Volume:76 ,  Issue: 2 )