By Topic

Mode‐mismatched thermal lens determination of temperature coefficient of optical path length in soda lime glass at different wavelengths

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Baesso, M.L. ; DIAS, UMIST, Manchester, M60 1QD, United Kingdom ; Shen, J. ; Snook, R.D.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.356045 

The time‐resolved and steady‐state mode‐mismatched thermal lens technique has been used to determine the temperature coefficient of optical path length ds/dT at different wavelengths of soda lime glasses (72 wt % SiO2, 18 wt % Na2O, 10 wt % CaO, and 70.5 wt % SiO2, 17.5 wt % Na2O, 10 wt % CaO, 2 wt % Fe2O3). The aberrant model, which takes into account the thickness change of the sample and is more realistic than the parabolic treatment when used to describe the thermal lens effect, was used as the theoretical model. The results showed that ds/dT is (2.1±0.1)×10-6 K-1 at 632.8 nm and (2.4±0.1)×10-6 K-1 at 442 nm for the undoped sample and (4.66±0.03)×10-6 K-1 at 632.8 nm and (6.1±0.1)×10-6 K-1 at 442 nm for the iron‐doped sample. The greater value of this parameter found for the doped sample at the absorption band (442 nm) was associated with the bigger value of the temperature coefficient of the electronic polarizability caused by the presence and environment of Fe3+ iron in the structure of the glass.

Published in:

Journal of Applied Physics  (Volume:75 ,  Issue: 8 )