Cart (Loading....) | Create Account
Close category search window

Comment on ‘‘Inverse problem for the nonexponential deep level transient spectroscopy analysis in semiconductor materials with strong disorder: Theoretical and computational aspects’’ [J. Appl. Phys. 74, 291 (1993)]

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Eiche, C. ; Kristallographisches Institut, University of Freiburg, Hebelstrasse 25, 79104 Freiburg, Germany ; Maier, D. ; Weese, J. ; Honerkamp, J.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link: 

It is shown that a recently proposed analysis of deep level transient spectroscopy signals with a regularization method by Batovski et al. [J. Appl. Phys. 74, 291 (1993)] can be simplified significantly by calculating the relaxation time spectrum of the capacitance transient with a regularization method directly.

Published in:

Journal of Applied Physics  (Volume:75 ,  Issue: 2 )

Date of Publication:

Jan 1994

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.