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Comment on ‘‘Inverse problem for the nonexponential deep level transient spectroscopy analysis in semiconductor materials with strong disorder: Theoretical and computational aspects’’ [J. Appl. Phys. 74, 291 (1993)]

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5 Author(s)
Eiche, C. ; Kristallographisches Institut, University of Freiburg, Hebelstrasse 25, 79104 Freiburg, Germany ; Maier, D. ; Weese, J. ; Honerkamp, J.
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It is shown that a recently proposed analysis of deep level transient spectroscopy signals with a regularization method by Batovski et al. [J. Appl. Phys. 74, 291 (1993)] can be simplified significantly by calculating the relaxation time spectrum of the capacitance transient with a regularization method directly.

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Journal of Applied Physics  (Volume:75 ,  Issue: 2 )