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The dependence of magnetic properties on film thickness in as‐deposited Co‐Ag alloys is discussed. Films ranging in Co concentration from 0 to 100 vol % Co and thicknesses between 100 Å and 1 μm were deposited by sputtering onto Si(100) substrates. It was found that both magnetoresistance (MR, Δρ) and MR ratio (Δρ/ρ) increase with thickness. Resistivity (ρ) decreases with increasing thickness. The dependence of MR ratio on concentration of Co is not markedly different for 200 and 2000‐Å‐thick samples. Saturation magnetization is roughly constant for thicknesses greater than ∼200 Å, decreasing rapidly below this cutoff. However, most of both the thin (200 Å) and thick (2000 Å) films begin showing magnetic hysteresis between 10 and 100 K. The differences in transport and magnetization properties may be ascribed to differences in film growth for thin versus thick films.