Cart (Loading....) | Create Account
Close category search window

γ‐ray diagnostics of α slowing in inertial confinement fusion targets

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Dendooven, Peter G. ; Plasma Physics Research Institute, University of California, Lawrence Livermore National Laboratory, P.O. Box 5508, Livermore, California 94550 ; Drake, R.Paul ; Cable, Michael D.

Your organization might have access to this article on the publisher's site. To check, click on this link: 

For large inertial confinement fusion deuterium‐tritium targets, a way to diagnose α slowing might be via capture reaction γ rays. Calculations are presented for two such methods: one uses the α+T direct capture γ rays, the other is based on a series of resonant α‐capture reactions. For small targets (ρR≤0.02 g/cm2), the total α+T γ‐ray yield relative to the DT neutron yield is temperature independent and proportional to the ρR value. For large targets (ρR≥0.2 g/cm2), this quantity becomes temperature dependent and ρR independent. Some experimental aspects are discussed.  

Published in:

Journal of Applied Physics  (Volume:74 ,  Issue: 6 )

Date of Publication:

Sep 1993

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.