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Plasma edge and its application to infrared measurement and detection

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1 Author(s)
Qian, Dingrong ; CCAST (World Laboratory), P. O. Box 8730, Beijing 100080National Laboratory for Infrared Physics, Academia Sinica, 420 Zhong Shan Bei Yi Road, Shanghai 200083, People’s Republic of China

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A steep plasma edge in infrared reflectivity spectra of Hg1-xCdxTe and HgSe:Fe has been observed. It is predicted that the edge is sensitive to the variation of carrier concentration, which indicates the possibility of developing a fast light‐controlled switch for infrared radiation as well as a new approach of infrared modulation and detection. The modulation gain in power and detectivity limited by the generation‐recombination process has been calculated and compared with the photoconductive counterpart.

Published in:

Journal of Applied Physics  (Volume:74 ,  Issue: 5 )