Cart (Loading....) | Create Account
Close category search window
 

The inflow moments method for the description of electron transport at material interfaces

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Schroeder, D. ; Technical University of Hamburg‐Harburg, Technical Electronics, Eissendorfer Strasse 38, D‐2100 Hamburg 90, Germany

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.351773 

This paper introduces the inflow moments method as a general procedure for the derivation of interface or boundary conditions for advanced models of carrier transport in semiconductor devices. It is based on a general interface condition for the Boltzmann equation accounting for particle and energy balance at material interfaces, as metal‐semiconductor contacts or semiconductor heterojunctions. Interface conditions for transport models based on integrations of the Boltzmann equation are consistently derived by the corresponding integrations of the Boltzmann interface condition. The method is illustrated by a treatment of thermionic emission of hot electrons at a semiconductor heterojunction, resulting in interface conditions for the particle as well as the energy balance equation.

Published in:

Journal of Applied Physics  (Volume:72 ,  Issue: 3 )

Date of Publication:

Aug 1992

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.