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Dependence of the x‐ray photoacoustic signal intensity of copper on sample thickness and modulation frequency

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4 Author(s)
Toyoda, Taro ; Department of Applied Physics and Chemistry, The University of Electro‐Communications, 1‐5‐1 Chofugaoka, Chofu, Tokyo 182, Japan ; Masujima, T. ; Shiwaku, H. ; Ando, M.

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The hard x‐ray photoacoustic signal intensities of copper have been measured at an x‐ray absorption near‐edge structure (XANES) region as functions of sample thickness (from 5 to 300 μm) and modulation frequency (from 5 to 50 Hz). It is shown that the photoacoustic signal intensities show maxima at the sample thickness close to 10 μm for each modulation frequency. The x‐ray photoacoustic signal varies from f-1.0 ( f denotes modulation frequency) up to 20 μm sample thickness, whereas it varies from f-0.5 beyond a 20 μm sample thickness, which is not consistent with the Rosencwaig–Gersho theory for the photoacoustic effect in solids.

Published in:

Journal of Applied Physics  (Volume:72 ,  Issue: 11 )