Cart (Loading....) | Create Account
Close category search window

Identification of point defects in hydrothermally grown KTiOPO4

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Scripsick, M.P. ; Physics Department, West Virginia University, Morgantown, West Virginia 26506 ; Edwards, G.J. ; Halliburton, L.E. ; Belt, R.F.

Your organization might have access to this article on the publisher's site. To check, click on this link: 

Electron paramagnetic resonance has been used to investigate radiation‐induced point defects in hydrothermally grown single crystals of potassium titanyl phosphate ( KTiOPO4 or KTP). The crystals were irradiated at 77 K with 60–kV x rays. A trapped‐hole center, a Ti3+ center, and a Pt3+ center were observed between 10 and 30 K after the initial 77‐K irradiation. These defects become thermally unstable near 160 K. The trapped hole is localized on an oxygen ion adjacent to a potassium vacancy and has resolved hyperfine interactions with three phosphorus nuclei. The Ti3+ ion is the intrinsic self‐trapped electron center in KTP and has weak hyperfine interactions with four phosphorus nuclei.

Published in:

Journal of Applied Physics  (Volume:70 ,  Issue: 6 )

Date of Publication:

Sep 1991

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.