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Multilayers alternating cobalt with different spacers such as iron and chromium at nanometric scale have been deposited by rf diode sputtering. The structures have been characterized in situ by kinetic ellipsometry and ex situ by grazing x‐ray reflection, x‐ray diffraction, Auger profile analysis, and transmission electron microscopy. Nuclear magnetic resonance (NMR) and high‐field SQUID magnetometry have been used to determine the magnetic properties. In Co/Fe multilayers the structure strongly depends on the cobalt thickness t
Published in:
Journal of Applied Physics
(Volume:69
,
Issue:
8
)
Date of Publication: Apr 1991