Close category search window
 

Coercivity of domain‐wall motion in thin films of amorphous rare‐earth–transition‐metal alloys

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Mansuripur, M. ; Optical Sciences Center, University of Arizona, Tucson, Arizona 85721 ; Giles, Roscoe ; Patterson, George

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.348250 

Computer simulations of a two‐dimensional lattice of magnetic dipoles are performed on the Connection Machine. The lattice is a discrete model for thin films of amorphous rare‐earth–transition‐metal alloys with application to erasable optical data‐storage systems. Simulated dipoles follow the dynamic equation of Landau, Lifshitz, and Gilbert under the influence of an effective magnetic field arising from local anisotropy, near‐neighbor exchange, classical dipole‐dipole interactions, and externally applied fields. By introducing several types of defects and inhomogeneities in the lattice, we show that the motion of domain walls can be hampered in various ways and to varying degrees.

Published in:
Journal of Applied Physics  (Volume:69 ,  Issue: 8 )

Date of Publication: Apr 1991

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.