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Characterization and modeling of transistors embedded in a high performance bipolar logic array

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1 Author(s)
Tyler, E.H. ; Appl. Micro Circuits Corp., San Diego, CA, USA

A set of high-frequency test structures for device characterization and the extraction of DC, CV, and AC bipolar SPICE model parameters has been implemented on a triple layer metal, high-performance bipolar logic array. These structures have proven useful in the development of accurate, statistically based SPICE models, relying on a readily available bank of logic array product base wafers. Sample results and the use of Hewlett-Packard's IC-CAP parameter extraction program to study these structures are discussed

Published in:

Microelectronic Test Structures, 1995. ICMTS 1995. Proceedings of the 1995 International Conference on

Date of Conference:

22-25 Mar 1995