Cart (Loading....) | Create Account
Close category search window
 

Volumetric stability of two‐step ionization dominated discharges

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Friedland, L. ; Science Research Laboratory, Incorporated, Somerville, Massachusetts 02143 ; Jacob, J.H. ; Mangano, J.A.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.343391 

The stability of self‐sustained discharges is investigated both analytically and numerically. The dominant ionization mechanism in the discharge is assumed to be two‐step ionization while both electron loss mechanisms attachment and recombination are considered. It is shown that the stiff voltage source is marginally stable when the electron loss rate is due solely to electron‐molecular ion recombination. In the presence of attachment the stiff voltage source is unstable and the growth rate of the instability is approximately the attachment rate. A stiff current is shown to be more stable and the discharge is stable irrespective of the loss rate. The theory is verified numerically for at atmospheric Co2 laser discharge.

Published in:

Journal of Applied Physics  (Volume:65 ,  Issue: 10 )

Date of Publication:

May 1989

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.