Close category search window
 

A measurement system for printed circuit board parameters based on image

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Bangshu Xiong ; Key Lab. of Nondestructive Test of Minist. of Educ., Nanchang Hangkong Univ., Nanchang ; Qiaofeng Ou

We develop a printed circuit board (PCB) measurement system to measure the line width, the angle between two lines, the pad diameter and the pad center position. We present the hardware constructions and the software design scheme. We propose the key algorithms on the measurement of the line width and pad parameters. The origin of measurement error is discussed. The solutions to reduce the measurement error are proposed. Experimental results demonstrate that the system is efficient and its measurement error is less than 2 mum. The system has been applied to manufacturing printed circuit boards and brought good social and economic benefits.

Published in:
Industrial Electronics and Applications, 2009. ICIEA 2009. 4th IEEE Conference on

Date of Conference: 25-27 May 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.