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An on-chip analog mixed-signal testing compliant with IEEE 1149.4 standard using fault signature characterization technique

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2 Author(s)
San-Um, W. ; Electron. & Photonic Syst. Eng., Kochi Univ. of Technol., Kami, Japan ; Tachibana, M.

A new on-chip analog mixed-signal testing compliant with IEEE 1149.4 standard is presented. The testing technique is based on sinusoidal output response characterizations, yielding a complete detection of AC and DC fault signatures without a need for simulation-before-test process. The testing system is an extension of IEEE 1149.4 standard, and affords functionalities for both pre-screening on-chip and high-quality off-chip testing. A demonstrating circuit-under-test, i.e. a 4th-order low-pass Gm-C filter, with the proposed testing approach is fully implemented in a physical level using 0.18 mum CMOS technology, and simulated using Hspice. The maximum operating frequency of the testing circuit is 260 MHz, where both catastrophic and parametric faults are potentially detectable at the parameter variation greater than 0.5% with low performance degradation. The fault coverage of faults associated in CMOS and capacitors are relatively high at 94.03% and 100%, respectively.

Published in:

Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology, 2009. ECTI-CON 2009. 6th International Conference on  (Volume:01 )

Date of Conference:

6-9 May 2009